解説21.イメージングの基礎と最新動向
(8) 走査プローブ顕微鏡（SPM）を用いた表面構造物性解析
2019 年 55 巻 12 号 p. 441-449
詳細
2019 年 55 巻 12 号 p. 441-449
Scanning probe microscopes（SPMs）have been used to analyze troubles, such as failures and deteriorations, of adhesive surfaces and interfaces. SPMs can use not only imaging of surface roughness but also imaging of surface viscoelastic properties, imaging of surface elastic modulus, and imaging of surface functional groups on polymer surfaces. This commentary briefly reviews the recent topics for polymer surface evaluated by imaging techniques of SPMs, such as DFM（Dynamic Force Microscope）, CFM（Chemical Force Microscope）, FCM（Force-Displacement Curve Mapping） and AFM-IR（ Atomic Force Microscopy-based Infrared Spectroscopy）, in our group.
