抄録
This paper describes the measuring device for glass surface temperature under shortwave radiant environments. The measuring method of proposing is as follows '. This method in which the cover glass (thickness 50μm〜75μm, 30mm by 30mm) for use in electronics and microscopes, coated thinly and uniformly with a cyanoacrylate-based colorless and transparent glue, is gently bonded onto the glass specimen with bare thermocouple element with diameter of 25μm sandwiched in between. We verify this measuring method by using radiation thermometer with a measurable wavelength range of approx. 8μm to 13μm, under equal distribution of luminous intensity from background surface.
