1994 年 43 巻 12 号 p. 1083-1086
We report the possibilities for multi-elemental analysis of suspended particulate matter (SPM) by glow discharge mass spectrometry (GDMS). To cope with the small sample volume, SPM sample was deposited on the surface of a high purity (7N grade) indium electrode. NIST SRM 1648 Urban Particulate Matter was analyzed to evaluate the method. For 34 elements, GDMS results agreed well with their reference values within a factor of 2 from the major constituents (12.5 wt % of Si) to the trace constituents (down to 0.8 μg/g of Eu), even when using typical relative sensitivity factors (RSF). A total of 53 elements including halogens were analyzed using approximately 10 mg of SPM sample by GDMS with sub-μg/g sensitivity.