Abstract
Existing techniques for evaluating the sugar content in sugar beet have considerable drawbacks, underscoring the need for
more efficient methods. Here, we introduce a fast and minimally invasive method for measuring Brix in sugar beet with
surface impurities using cost-effective handheld NIR spectrometers. Applicable in laboratories and potentially on-site, the
method shows that spectral variations due to measurement locations minimally affect accuracy. The LinkSquare NIR
spectrometer performed best with PLS regression on averaged intact spectra using smoothing and standard normal variate
pre-treatment. The S-G1 spectrometer achieved superior results with PLS regression on the averaged peeled spectra without
pre-treatment. These findings demonstrate the efficacy of handheld NIR spectrometers for sugar beet analysis and offer
strategies for optimizing their accuracy and practicality.