A simple calibration method for measuring electric current waveforms using a microstrip line

Abstract

The non-contact measurement method standardized by the IEC to measure of high-frequency current spectra on a trace connected to LSI power supply leads is used to evaluate electromagnetic interference (EMI). However, spectrum measurement is useful only for estimating the time-averaged behavior of LSIs. This paper describes a simple calibration method for measuring the electric current waveform flowing in the strip conductor of a microstrip line. This method is useful for evaluating the time - varying behavior of LSIs. The measurement errors for this method are also evaluated.