Proceedings of JIEP Annual Meeting
The 28th JIEP Annual Meeting
Session ID : 5B-08
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Host: Japan Institute of Electronics Packaging

The 28th JIEP Annual Meeting
A photo-desmear process using a VUV light source
*Hiroki Horibe, Tomoyuki Habu, Shintaro Yabu, Kenichi Hirose, Makoto Wasamoto, Shinichi Endo
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Keywords: photo-desmear, VUV, desmear
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[in Japanese]
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© 2014 The Japan Institute of Electronics Packaging
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