抄録
A dual-probe scanning near-field optical microscope was developed. The probe pair positioning was carried out using conventional microscopy with an accuracy beyond the diffraction limit. The distance dependence of the inter-probe light transfer was measured to show the strong far-field influences. A dual-probe observation of an optical grating was performed. Gained two signals contained various information from the probe-pair and the sample. A method to process the two signals was suggested and discussed using three dimensional finite-difference time-domain simulations. Two independent signals specific to each probe were shown to be extracted by the procedure. [DOI: 10.1380/ejssnt.2012.426]
