Conference -ALC '17-
Preface for the Special Issue of ALC '17
2018 年 16 巻 p. A1-A2
詳細
2018 年 16 巻 p. A1-A2
The 11th International Symposium “Atomic Level Characterization for New Materials and Devices (ALC '17)” under the auspices of the 141st Committee on Microbeam Analysis of the Japan Society for the Promotion of Science (JSPS) was held in Aqua Kauai Beach Resort, Kauai, Hawaii, gathering 251 participants from 19 countries. In this symposium, 209 papers in total, including one Tutorial and three Plenaries, have been presented. Fourteen papers out of them are collected in this special issue. [DOI: 10.1380/ejssnt.2018.A1]
