Angular Dependence of Multi-atom Resonant X-ray Raman Scattering

抄録

We study the polarization dependence of the structure factor in multi-atom resonant X-ray Raman (MARX-Raman) scattering. The calculations for the GaN (C_3v) and SnO₂ (C_2v) show some preferable structures to enhance the MARX-Raman signal intensity through the structure factor which depends on the relative arrangement of the incident X-ray polarization and the surrounding local atomic geometry. The theoretical calculations help us to derive new information from the MARX-Raman.