Time-of-Flight-type Photoelectron Emission Microscopy with a 10.9-eV Laser

抄録

We have developed a novel photoemission microscopy apparatus employing a vacuum ultraviolet laser. This setup combines photoemission electron microscopy (PEEM) with a time-of-flight detector, facilitating rapid visualization of electronic states in both real and momentum space. Achieving a spatial resolution of 70 nm, attributed to the PEEM lens system, we showcase the full band mapping of a Bi(111) single crystal film using angle-resolved photoemission spectroscopy within a short acquisition time.