Dynamic Observation of Sn/Si(111) Surface Structures by Low Energy Electron Microscope

抄録

Dynamic surface structures of Tin (Sn) on Si(111) were studied by using low energy electron microscope (LEEM). Different from the reported phase diagram, (√3 × √3)-R 30° Sn structure is found existing only in a narrow Sn film thickness range and disappearing quickly over 1/3 monolayer (ML) Sn deposition at substrate temperature of 400°C. Sn islands, which are different from the S-K mode growth, begin to grow from around 1/5 ML along steps or domain boundaries. The models of Sn growth on Si(111) are proposed. [DOI: 10.1380/ejssnt.2005.350]