抄録
Extended X-ray absorption fine structure (EXAFS) measurements were carried out in order to investigate the phase transition of bismuth clusters from semi-metallic nanocrystal to semiconducting amorphousness depending on the size. XAFS functions were Fourier-transformed and analyzed by the curve fitting method. The peaks around 3.0 Å and 3.6 Å are attributed to the nearest neighbors within the the layer and between the interlayer, respectively. In the 0.5 nm thick films the covalent bond length within the layer slightly shortens and the peak originated from the interlayer disappears. [DOI: 10.1380/ejssnt.2005.370]
