Erratum: Epitaxial Growth of Bi(111) on Si(001) [e-J. Surf. Sci. Nanotech. Vol. 7, pp. 441-447 (2009)]

G. Jnawali; H. Hattab; C. A. Bobisch; A. Bernhart; B. Krenzer; E. Zubkov; C. Deiter; T. Weisemoeller; F. Bertram; J. Wollschläger; R. Möller; M. Horn-von Hoegen

doi:10.1380/ejssnt.2009.795

Errata

Erratum: Epitaxial Growth of Bi(111) on Si(001) [e-J. Surf. Sci. Nanotech. Vol. 7, pp. 441-447 (2009)]

G. Jnawali, H. Hattab, C. A. Bobisch, A. Bernhart, B. Krenzer, E. Zubkov, C. Deiter, T. Weisemoeller, F. Bertram, J. Wollschläger, R. Möller, M. Horn-von Hoegen

著者情報

キーワード: Bismuth, Low-energy electron diffraction (LEED), Dislocation, Scanning tunneling microscopy (STM), Heteroepitaxy, X-ray diffraction, X-ray reflectivity

ジャーナルフリー

2009 年 7 巻 p. 795

DOI https://doi.org/10.1380/ejssnt.2009.795

Original Article : e-JSSNT Vol. 7, pp. 441-447 (2009)

詳細

抄録

In this article [1], one of the coauthors, B. Krenzer, is missing in the author list by mistake. The correct author list is the same as the one shown in this erratum.

責任著者(Corresponding author)

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