抄録
The multi-technique approach in the spectroscopic photoemission and low-energy electron microscope (SPELEEM) has proven to be a powerful tool in studies of crystalline, chemical and magnetic structures at surfaces. The energy filtering offered by this instrument enables a variety of complementary analytical characterization methods. Here, we give a summary of the recent studies with the SPELEEM microscope installed at the Nanospectroscopy beamline of the Elettra synchrotron laboratory. The examples cover topics such as surface corrugation in free-standing graphene layers, spin-reorientation transition in thin Fe films on W(110), and stress-induced adsorbate patterns on single crystal surfaces. Moreover, the SPELEEM capabilities of imaging inelastically scattered electrons are demonstrated. [DOI: 10.1380/ejssnt.2011.72]
