抄録
We developed a new method for measuring LC property constants. The method uses a type of VR oriented film where the LC direction is perpendicular to the rubbing direction, uses the tilt of the electrical field to control the tilting direction of LC, and uses CV characteristics to determine LC property constants. Threshold voltage, elastic and dielectric constants can now be found and accurately measured from CV characteristic measurements by linear approximation in the high-voltage range through this method.
