主催: The Japanese Liquid Crystal Society
会議名: 2000年 日本液晶学会討論会
開催地: くにびきメッセ
開催日: 2000/10/25 - 2000/10/27
p. 53-54
Fine structures for liquid crystal alignment were formed on the alignment layer by an atomic force microscopy. A structure is check pattern, which is consisted of multi-domains with two writing directions. As the distance from the surface increases, the direction of director in the bulk seems to be merged into a direction. The merging distance is supposed to be proportional to the domain size. The same phenomenon occurs with the circular pattern. Merging of the aligning direction in the bulk is due to the tendency to reduce the elastic energy.