主催: 日本液晶学会
会議名: 2000年 日本液晶学会討論会
開催地: くにびきメッセ
開催日: 2000/10/25 - 2000/10/27
p. 55-56
The electrical response of the LC directors in the bulk and near the surface were investigated by transmission and total reflection (TRE) ellipsometries, respectively. Since the static response of the phase difference on the electric field measured by the TRE depends on the interfacial LC director reorientation, the polar anchoring strength of the LC cell was evaluated quantitatively. The director reorientation in the bulk was also analyzed by the transmission ellipsometry, which was taken the anchoring energy into account.