日本液晶学会討論会講演予稿集
Online ISSN : 2432-5988
Print ISSN : 1880-3490
ISSN-L : 1880-3490
2000年 日本液晶学会討論会
会議情報

1B13 エリプソメトリーによるネマティック液晶の電場応答解析
*奥谷 聡木村 宗弘赤羽 正志鳥海 弥和赤尾 賢一田所 利康
著者情報
会議録・要旨集 フリー

p. 55-56

詳細
抄録

The electrical response of the LC directors in the bulk and near the surface were investigated by transmission and total reflection (TRE) ellipsometries, respectively. Since the static response of the phase difference on the electric field measured by the TRE depends on the interfacial LC director reorientation, the polar anchoring strength of the LC cell was evaluated quantitatively. The director reorientation in the bulk was also analyzed by the transmission ellipsometry, which was taken the anchoring energy into account.

著者関連情報
© 2000 日本液晶学会
前の記事 次の記事
feedback
Top