日本液晶学会討論会講演予稿集
Online ISSN : 2432-5988
Print ISSN : 1880-3490
ISSN-L : 1880-3490
2000年 日本液晶学会討論会
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1B14 全反射エリプソメトリーによる液晶界面フリッカー現象の解析
*田所 利康赤尾 賢一奥谷 聡木村 宗弘赤羽 正志鳥海 弥和
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p. 57-58

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The optical flickering effect in a nematic ECB cell has been studied using total-reflection time-resolved spectroellipsometry (TRSE). Under an applied bipolar electric field, optical flickering arises from a change in internal electric field caused by various factors such as the presence of ionic impurities and surface charges. In the present study, in order to investigate the relationships between flickering frequency and the various factors that cause optical flickering, we examine the frequency dependence of flickering magnitude and waveform. We found that the magnitude of optical flickering in the middle frequency region (0.1lkHz to lkHz) caused by high-mobility ionic impurities increases after the aging process.

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