IEICE Electronics Express
Online ISSN : 1349-2543
ISSN-L : 1349-2543
LETTER
Full-Wave analysis of microstrip lines with variable thickness substrates using the method of lines
Alia ZakritiMohamed Essaaidi
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2004 Volume 1 Issue 7 Pages 182-187

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Abstract

In this paper, we present a full-wave analysis of microstrip lines printed on variable thickness substrates using the method of lines (MoL). The propagation constant of a microstrip line in the interface of one dielectric is computed as a function of different shape characteristics. The results are compared with those obtained in previous research, especially with those using the discrete mode matching technique (DMM). Good agreement is found between the results. Furthermore, the convergence behavior of the method of lines is examined and finally, we show some numerical results, obtained with analyzing this structure in a large band of frequencies.

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© 2004 by The Institute of Electronics, Information and Communication Engineers
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