IEICE Electronics Express
Online ISSN : 1349-2543
ISSN-L : 1349-2543
LETTER
Robust C-element design for soft-error mitigation
I-Chyn WeyBing-Chen WuChien-Chang PengCihun-Siyong Alex GongChang-Hong Yu
著者情報
キーワード: C-element, soft error
ジャーナル フリー

2015 年 12 巻 10 号 p. 20150268

詳細
抄録
C-element is a widely used component in soft-error tolerant designs to construct a robust soft-tolerant mechanism; however, C-element itself is not a robust device. In this paper, we proposed a robust C-element design by employing two transistors operating in saturation region parallel connected with C-element upper pMOS and lower nMOS to enhance its soft-error tolerance. By utilizing the proposed C-element in the prior-art isolated latch designs, the maximum soft error tolerance can be improved by 25.87% as compared with conventional C-element.
著者関連情報
© 2015 by The Institute of Electronics, Information and Communication Engineers
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