IEICE Electronics Express
Online ISSN : 1349-2543
ISSN-L : 1349-2543
LETTER
Impacts of flexible Vth control, low process variability, and steep SS with low on-current of new structure transistors to ultra-low voltage designs
Yasuhiro OgasaharaTadashi NakagawaToshihiro SekigawaToshiyuki TsutsumiHanpei Koike
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ジャーナル フリー

2015 年 12 巻 15 号 p. 20150460

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This paper discusses impacts of flexible Vth control, low process variability, and steep SS with small on-current of new structure devices on ultra-low voltage circuits. Our simulation results based on PTM 22 nm model clarify applicability of ultra-low voltage operation to a nominal speed common SoC designs by an introduction of Vth control as well as low power sensor nodes. We also reveal requirement of process variability suppression for high energy efficiency with steep SS transistors, and utilization of small on-current steep SS transistors to low power and low speed applications. Our qualitative discussion well explains these experiment results.
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© 2015 by The Institute of Electronics, Information and Communication Engineers
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