Erratum: Assessing alpha-particle-induced SEU sensitivity of flip-chip bonded SRAM using high energy irradiation [IEICE Electronics Express Vol. 13 (2016) No. 17 pp. 20160627]

Saqib A. Khan; Shi-Jie Wen; Sanghyeon Baeg

doi:10.1587/elex.13.20168001

IEICE Electronics Express

Online ISSN : 1349-2543
ISSN-L : 1349-2543

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Erratum: Assessing alpha-particle-induced SEU sensitivity of flip-chip bonded SRAM using high energy irradiation [IEICE Electronics Express Vol. 13 (2016) No. 17 pp. 20160627]

Saqib A. Khan, Shi-Jie Wen, Sanghyeon Baeg

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JOURNAL FREE ACCESS

2016 Volume 13 Issue 19 Pages 20168001

DOI https://doi.org/10.1587/elex.13.20168001

IEICE Electron. Express : Vol. 13 (2016) No. 17 pp.20160627-20160627

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