IEICE Electronics Express
Online ISSN : 1349-2543
LETTER
Subthreshold 8T SRAM sizing utilizing short-channel Vt roll-off and inverse narrow-width effect
Ik Joon ChangJoon-Sung Yang
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JOURNALS FREE ACCESS

2016 Volume 13 Issue 8 Pages 20160020

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Abstract

8T SRAM have been considered for robust subthreshold SRAM design. Their subthreshold operation was successfully demonstrated through real silicon measurements. However, Monte-Carlo simulation results show that this SRAM still may not deliver sufficient reliability in subthreshold operation. In this work, we overcome this problem by properly sizing SRAM transistors. We utilize short-channel Vt roll-off and inverse narrow-width effect for the sizing. Since minimum geometry transistors are employed in the SRAM bit-cell, these effects can have profound impact on SRAM stability. Hence, the proposed approach provides an efficient way to increase the yield of the 8T subthreshold SRAMs.

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© 2016 by The Institute of Electronics, Information and Communication Engineers
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