IEICE Electronics Express
Online ISSN : 1349-2543
ISSN-L : 1349-2543
LETTER
A latch-latch composition of metastability-based true random number generator for Xilinx FPGAs
Naoki FujiedaShuichi Ichikawa
Author information
JOURNAL FREE ACCESS

2018 Volume 15 Issue 10 Pages 20180386

Details
Abstract

Metastability of RS latches can be a source of entropy for true random number generators (TRNGs). This study presents a new composition of an RS latch using the latch functionality of storage elements of Xilinx FPGAs. Our TRNG is implemented as a soft macro, or RTL description with directives, which is easily integrated into other logic components. According to our evaluation with an Artix-7 FPGA (XC7A35T), our TRNG with 320 latches (716 LUTs and 974 registers) passed the NIST SP 800-22 test suite without post-processing. Also, our new TRNG presented a 2.3x better area-delay product than the existing design to pass the diehard test.

Content from these authors
© 2018 by The Institute of Electronics, Information and Communication Engineers
Previous article Next article
feedback
Top