A novel self-recoverable and triple nodes upset resilience DICE latch

抄録

With the CMOS technology scaling down, the normal latch is more susceptible to soft errors caused by radiation particles. In this paper, we proposed a low-power and highly reliable radiation hardened latch to enhance the single event upset (SEU) tolerance. Based on DICE latch and Muller C-element circuit, the proposed latch can provide 100% fault tolerance, which can be used for space applications in severe ray radiation environments. The simulation show that’s it not only can completely tolerate an SEU on any one of its internal single node, but it also can provide double-node and triple-node upsets protection for facultative initial state of the latch. What’s more, compared with other hardened latches, the proposed cell has comparable or better performance in the matter of delay time and power.