A novel highly reliable and low-power radiation hardened SRAM bit-cell design

抄録

In this paper, an improved SEU hardened SRAM bit-cell, based on the SEU physics mechanism and reasonable circuit-design, is proposed. The proposed SRAM cell can offer differential read operation for robust sensing. By using 90 nm standard digital CMOS technology, the simulation results show that the SRAM cell can provide full immunity for single node upset and multiple-node upset. And its critical charge is 25 times compared with Quatro10T. Besides, by comparing several electrical parameters, the proposed SRAM cell has the highly reliable and low-power capability for severe radiation environment application.