IEICE Electronics Express
Online ISSN : 1349-2543
ISSN-L : 1349-2543
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A dV/dt noise canceling circuit of capacitive-isolated gate drivers
Xuefei ZhangTiantian LiuYuhua QuanXiaoyi HuangXinhong ChengYuehui Yu
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2022 年 19 巻 21 号 p. 20220338

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For capacitive-isolated gate drivers, the pulse width distortion (PWD) and common mode transient immunity (CMTI) are vital factors to evaluate its performance. In this paper, an envelope detection circuit and a dV/dt noise canceling circuit of capacitive-isolated gate drivers is designed based on X-FAB 0.35µm CMOS process. With these structures, this gate driver alleviates PWD and improve CMTI. Spectre simulation results show that the gate driver achieves 200kV/µs CMTI with 50ns propagation delay and maximum 7.4ns PWD. Besides, it has better robustness to fabrication process and temperature variation than conventional methods.

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© 2022 by The Institute of Electronics, Information and Communication Engineers
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