IEICE Electronics Express
Online ISSN : 1349-2543
ISSN-L : 1349-2543
LETTER
Voltage stress-induced performance degradation in NMOSFET mixer
C. YuH. YangE. XiaoJ. S. Yuan
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JOURNALS FREE ACCESS

2005 Volume 2 Issue 5 Pages 133-137

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Abstract

This paper presents an insight into the performance degradation in Gilbert mixer due to the voltage stress-induced hot carrier effects. Analytical analysis relates the performance degradation with the model parameter shifts caused by voltage stress. The stress-induced parameter shifts are examined experimentally. Performance degradation in mixer is investigated through Spectre-RF simulation with the models extracted from measured data.

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© 2005 by The Institute of Electronics, Information and Communication Engineers
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