抄録
A novel high-speed optical reflectometry with high-reflectance-resolution is demonstrated by synthesis of optical coherence function for diagnosis of optical fiber assembly modules. In this new scheme, the optical frequency of a laser source is modulated doubly: one in sinusoidal wave to synthesize a coherence peak scanning along the fiber under test for distributed reflection/scattering measurement, the other in linear sweep to make the wavelength domain averaging optically for high reflectance resolution. Experimental results show that a reflection-distribution profile with reflectance-resolution better than 0.1dB can be obtained within 1 minute with this method.
