IEICE Electronics Express
Online ISSN : 1349-2543
LETTER
Calibration of electric field probes with three orthogonal elements by standard field method
Ifong WuShinobu IshigamiKaoru GotohYasushi Matsumoto
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2009 Volume 6 Issue 14 Pages 1032-1038

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Abstract

Electric field probes with three orthogonal elements were calibrated from 1-6GHz by the standard field method in an anechoic chamber. A special jig was constructed for setting and calibrating a Δ-beam-type probe. Calibration factors of the probes were obtained for each element using this jig. To reflect the future revision of IEC 61000-4 series, uncertainty in the calibration factors was investigated to improve calibration quality and determine the factors affecting calibration. We found that fluctuation in the power transmitted from a high power amplifier and the imperfection of the anechoic chamber were the most important factors affecting uncertainty.

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© 2009 by The Institute of Electronics, Information and Communication Engineers
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