IEICE Electronics Express
Online ISSN : 1349-2543
ISSN-L : 1349-2543
LETTER
Probe calibration by using a different type of probe as a reference in GTEM cell above 1GHz
Ifong WuShinobu IshigamiKaoru GotohYasushi Matsumoto
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2010 Volume 7 Issue 6 Pages 460-466

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Abstract

Calibration of an electric field probe using a different type and size of probe as a reference is carried out in a GTEM cell from 1 to 6GHz. We compared our results with those of calibration in an anechoic chamber to determine the effectiveness of the calibration. The difference between the calibration factors of the GTEM cell and the anechoic chamber increases when the probe is calibrated in an area in which the electric field distribution is nonuniform. Therefore, it is important to place the probe in an area with good uniformity or maintain the uniformity of the electric field in the GTEM cell when calibrating electric field probes with different dimensions.

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© 2010 by The Institute of Electronics, Information and Communication Engineers
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