IEICE Electronics Express
Online ISSN : 1349-2543
ISSN-L : 1349-2543

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Single error correction, double error detection and double adjacent error correction with no mis-correction code
Ho-yoon JunYong-surk Lee
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ジャーナル フリー 早期公開

論文ID: 10.20130743

この記事には本公開記事があります。
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Single error correction, double error detection and double adjacent error correction (SEC-DED-DAEC) code without mis-correction of double non-adjacent error is proposed to achieve high reliability protection against soft errors in on-chip memory systems. To eliminate mis-correction among information bits, the orthogonality of orthogonal Latin square codes is engrafted in the H-matrix of the proposed code. Experimental results show that there is no mis-correction for the proposed code and the overhead of implementation is lower than that of other SEC-DED-DAEC codes. The proposed SEC-DED-DAEC code is suitable for applications to on-chip memory with high reliability.
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© 2013 by The Institute of Electronics, Information and Communication Engineers
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