IEICE Electronics Express
Online ISSN : 1349-2543
ISSN-L : 1349-2543

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Mitigating the SERs of Large Combinational Circuits by Using Half Guard Band Technique in CMOS Bulk Technology
Liang BinDu YankangXuhui
著者情報
キーワード: SERs, half guard band, layout, SET
ジャーナル フリー 早期公開

論文ID: 11.20140710

この記事には本公開記事があります。
詳細
抄録
A novel technique is proposed to mitigate the SERs of combinational circuits by using the half guard band. During the layout placement, by sharing the guard band between physically adjacent cells, the soft error rates (SERs) can be effectively with less performance penalty. Three-dimensional technology computer-aided design (TCAD) numerical simulation and circuit-level simulation are adopted to demonstrate the hardening performance.
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© 2014 by The Institute of Electronics, Information and Communication Engineers
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