Extremely small differential non-linearity in a DMOS capacitor based cyclic ADC for CMOS image sensors

Zhiheng Wei; Keita Yasutomi; Shoji Kawahito

doi:10.1587/elex.11.20140893

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引用する場合も本公開記事を引用してください。

Extremely small differential non-linearity in a DMOS capacitor based cyclic ADC for CMOS image sensors

Zhiheng Wei, Keita Yasutomi, Shoji Kawahito

著者情報

キーワード: DNL, cyclic ADC, DMOS capacitors, split sampling capacitors

ジャーナルフリー早期公開

論文ID: 11.20140893

DOI https://doi.org/10.1587/elex.11.20140893

この記事には本公開記事があります。

The final version of this article is now available: Vol. 11 (2014), No. 20 pp. 20140893-20140893

詳細

抄録

This letter reports an extremely small differential non-linearity (DNL) in a cyclic analog-to-digital converter (ADC) using depletion-mode MOS (DMOS) capacitors for CMOS image sensors (CISs). Compared with conventional 1.5b digital-to-analog converter (DAC) configuration using 3 reference signals, the cyclic ADC with split sampling DMOS capacitors in the 1.5b DAC has the maximum DNL of +0.125/-0.125 LSB at 14b despite the large applied voltage dependency of the DMOS capacitors of 2.47%.

責任著者(Corresponding author)

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