Complex permittivity extraction from PCB stripline measurement using recessed probe launch

Chulsoon Hwang; Woocheon Park; Dong Gun Kam

doi:10.1587/elex.12.20150023

This article has now been updated. Please use the final version.

Complex permittivity extraction from PCB stripline measurement using recessed probe launch

Chulsoon Hwang, Woocheon Park, Dong Gun Kam

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Keywords: Complex permittivity, dielectric constant, loss tangent, printed circuit board, recessed probe launch, stripline

JOURNAL FREE ACCESS Advance online publication

Article ID: 12.20150023

DOI https://doi.org/10.1587/elex.12.20150023

The final version of this article is now available: Vol. 12 (2015), No. 5 pp. 20150023-20150023

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Abstract

A method to extract the complex permittivity of a dielectric material in a PCB is presented. The recessed probe launch allows striplines to be measured without the need of via transitions that are subject to large process variations. After pad parasitics are de-embedded using the two-line method, the complex permittivity of the dielectric is calculated from 20 MHz to 5 GHz using closed-form equations. Internal inductance is taken into account to prevent overestimation of the permittivity at low frequency.

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