Complex permittivity extraction from PCB stripline measurement using recessed probe launch

Chulsoon Hwang; Woocheon Park; Dong Gun Kam

doi:10.1587/elex.12.20150023

この記事には本公開記事があります。本公開記事を参照してください。
引用する場合も本公開記事を引用してください。

Complex permittivity extraction from PCB stripline measurement using recessed probe launch

Chulsoon Hwang, Woocheon Park, Dong Gun Kam

著者情報

キーワード: Complex permittivity, dielectric constant, loss tangent, printed circuit board, recessed probe launch, stripline

ジャーナルフリー早期公開

論文ID: 12.20150023

DOI https://doi.org/10.1587/elex.12.20150023

この記事には本公開記事があります。

The final version of this article is now available: Vol. 12 (2015), No. 5 pp. 20150023-20150023

詳細

抄録

A method to extract the complex permittivity of a dielectric material in a PCB is presented. The recessed probe launch allows striplines to be measured without the need of via transitions that are subject to large process variations. After pad parasitics are de-embedded using the two-line method, the complex permittivity of the dielectric is calculated from 20 MHz to 5 GHz using closed-form equations. Internal inductance is taken into account to prevent overestimation of the permittivity at low frequency.

責任著者(Corresponding author)

J-STAGEへの登録はこちら（無料）