抄録
A single-event transient (SET) hardened LDO using novel structure is proposed to enhance the single-event effect tolerance. The novel LDO with built-in filter can mitigate the response of the sensitive nodes of circuit. If the SET pulse current flows through the sensitive nodes, the maximum variation of the output voltage is only 15.5mV. In addition, the transient performance is slightly dropped back as a tradeoff for the built-in filter. When the workload changes transiently between 100μA and 100mA in 100ns, the undershoot is 28.4mV and the overshoot is nearly 20mV with imperceptible peak.
