Physical-aware gating element insertion for thermal-safe scan shift operation
論文ID: 14.20161181
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論文ID: 14.20161181
Additional gating elements are inserted at the outputs of scan flip-flop to freeze unnecessary transitions from scan flip-flops to combinational logic such that the hot temperature is avoided during scan shift. This paper presents a new physical-aware gating element insertion method performed after initial cell placement while satisfying timing and placement density constraints, thus it avoids hotspots during scan shift operation.
