A Novel TLP-based Method to Deliver IEC 61000-4-2 ESD Stress
論文ID: 14.20170163
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論文ID: 14.20170163
The electro-static discharging (ESD) gun test method is widely used and admitted for systems, but it will also bring some unwished factors to influence the accuracy and stability such as radiated electromagnetic (EM) and the unstable hand-held operational approach. In order to avoid the above factors, a traditional work uses a modified transmission line pulse (TLP) tester to deliver the IEC 61000-4-2 stress. However, the modification and recovery process of a TLP tester is complicated in addition to the potential damaging risks. Thus, this work proposes a novel TLP-based method to generate the IEC stress by adding an extra circuit network outside the TLP tester. Further, the proposed method with no need for internally modifying a TLP tester can efficiently solve the above issues.
