IEICE Electronics Express
Online ISSN : 1349-2543
ISSN-L : 1349-2543

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Measurements of Metastability in MUTEX on an FPGA
Nguyen Van ToanDam Minh TungJeong-Gun Lee
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JOURNAL FREE ACCESS Advance online publication

Article ID: 14.20171165

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Abstract

In this paper, we propose a new method for measuring metastability in the mutual exclusion element (MUTEX) implemented on a Field Programmable Gate Array (FPGA). Our method uses fine-grained phase shifts of a digital clock manager to trigger Flip-Flops to generate concurrent inputs for a MUTEX. By dynamically adjusting the phase shift between two clock signals, we can force the MUTEX into a metastable state. The benefit of our approach is that it is easier to force the MUTEX become metastable compared to the conventional approach using two un-correlated signals. The experiments have been performed on a Xilinx Spartan-6 (XC6SLX9-4TQG144C).

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© 2017 by The Institute of Electronics, Information and Communication Engineers
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