Modeling Analysis of an Equivalent Circuit for Capacitive-Type Level Transducer Considering Internal Edge Effect

抄録

Capacitive-type level transducers are widely employed due to the increasing demand for level monitoring in various industrial systems. Accurate modeling of these transducers is crucial for improving their measurement performance. This paper introduces an equivalent circuit model for capacitive-type level transducers that accounts for the internal edge effect, addressing limitations of traditional models, which often overlook the actual conditions between the inner and outer electrode bases. Furthermore, this paper proposes a novel analytical approach based on electromagnetic field analysis to characterize the internal edge effect. To validate the proposed model, a capacitive-type level transducer was fabricated, and performance was tested using several prototypes with varying distances between the inner and outer electrode bases, leveraging finite element method (FEM) simulations and experimental results.