A high bit rate and self-stable probability true random number generator based on magnetic tunnel junction for IoT security applications

Sinan Zou; Xing Zhao; Yuan Xue; Jianfeng Gao; Yilu Li; Yan Cui; Jun Luo

doi:10.1587/elex.22.20250084

This article has now been updated. Please use the final version.

A high bit rate and self-stable probability true random number generator based on magnetic tunnel junction for IoT security applications

Sinan Zou, Xing Zhao, Yuan Xue, Jianfeng Gao, Yilu Li, Yan Cui, Jun Luo

Author information

Sinan Zou
State Key Laboratory of Fabrication Technologies for Integrated Circuits, Institute of Microelectronics of the Chinese Academy of Sciences
Institute of Microelectronics, Chinese Academy of Sciences (IMECAS)
University of Chinese Academy of Sciences (UCAS)
Xing Zhao
State Key Laboratory of Fabrication Technologies for Integrated Circuits, Institute of Microelectronics of the Chinese Academy of Sciences
Institute of Microelectronics, Chinese Academy of Sciences (IMECAS)
Yuan Xue
State Key Laboratory of Fabrication Technologies for Integrated Circuits, Institute of Microelectronics of the Chinese Academy of Sciences
Institute of Microelectronics, Chinese Academy of Sciences (IMECAS)
Jianfeng Gao
State Key Laboratory of Fabrication Technologies for Integrated Circuits, Institute of Microelectronics of the Chinese Academy of Sciences
Institute of Microelectronics, Chinese Academy of Sciences (IMECAS)
Yilu Li
State Key Laboratory of Fabrication Technologies for Integrated Circuits, Institute of Microelectronics of the Chinese Academy of Sciences
Institute of Microelectronics, Chinese Academy of Sciences (IMECAS)
Yan Cui
State Key Laboratory of Fabrication Technologies for Integrated Circuits, Institute of Microelectronics of the Chinese Academy of Sciences
Institute of Microelectronics, Chinese Academy of Sciences (IMECAS)
Jun Luo
State Key Laboratory of Fabrication Technologies for Integrated Circuits, Institute of Microelectronics of the Chinese Academy of Sciences
Institute of Microelectronics, Chinese Academy of Sciences (IMECAS)
University of Chinese Academy of Sciences (UCAS)

Keywords: IoT, true random number generator, magnetic tunnel junction, spin-orbit torque

JOURNAL FREE ACCESS Advance online publication

Article ID: 22.20250084

DOI https://doi.org/10.1587/elex.22.20250084

The final version of this article is now available: Vol. 22 (2025), No. 9 pp. 20250084-20250084

Details

Abstract

True random number generator (TRNG) is an essential part of cryptographic systems. In this paper, a high bit rate and self-stable probability TRNG based on spin-orbit torque magnetic tunnel junction (SOT-MTJ) is proposed. The TRNG reaches 16.7 Mb/s bit rate and 93.62 pJ/bit energy consumption for a single cell. In addition, the TRNG achieves a stable probability of random numbers regardless of the voltage and device to device variation. The random bits have passed the National Institute of Standards and Technology statistical test suite. Our results provide a candidate of high bit rate TRNG for IoT security applications.

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