地質学雑誌
Online ISSN : 1349-9963
Print ISSN : 0016-7630
ISSN-L : 0016-7630
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走査型電子顕微鏡(SEM)用の断層中軸部小型定方位試料の作製法
島田 耕史亀高 正男中山 一彦瀬下 和芳田中 義浩林 俊夫田中 遊雲下釜 耕太岡崎 和彦
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ジャーナル フリー

2013 年 119 巻 11 号 p. 727-731

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Staples for a stapler can be used as frames for collecting small oriented samples from fragile and rare areas of fault gouge. Slots are produced on the surface of the fault gouge in order to insert staples; these staples are used in groups of 10 or less and comprise three small surfaces at right angles to each other. Pre-oriented staples within the slot are then removed before preparation for Scanning Electron Microscope (SEM) observation and analysis. This approach requires staples, a knife and other simple equipment for use in both the field and laboratory.
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© 2013 日本地質学会
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