日本ゴム協会誌
Print ISSN : 0029-022X
総説
走査透過型電子顕微鏡(STEM)による高分子材料の多次元構造解析
堀内 伸
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ジャーナル フリー

2024 年 97 巻 2 号 p. 22-26

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Multidimensional structural analyses of polymer materials through scanning transmission electron microscopy (STEM) are utilized to investigate diverse structural factors, encompassing three-dimensional spatial structure, elemental composition, chemical structure, and even time-dependent structural changes. STEM-EDX-tomography facilitates 3D elemental mapping of silica-filled rubber blends. STEM-EELS/ELNES phase mapping enables chemical mapping of the phase separation in polymer alloys. In-situ STEM provides the capability for real-time observation of the failure process of the adhesive interface, employing a tensile strain specimen holder.

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