入門講座「中性子反射率測定」
斜入射小角中性子散乱の可能性：薄膜中で秩序化したソフトマターの解析に向けて
2009 年 19 巻 4 号 p. 238-241
詳細
2009 年 19 巻 4 号 p. 238-241
Grazing incident small angle scattering has been used for the analysis of surface and thin film structures. X-ray in particular is widely used for such analysis and called grazing incident small angle X-ray scattering (GISAXS). However, a very limited number of studied has been done using grazing incident small angle neutron scattering (GISANS) primarily due to low intensity of neutron beam. The arising JPARC neutron source will enable us to use GISANS to analyze thin film structures of softmatter. This report provides a basic concept of GISAS using an example of the analysis of nanocellular thin films fabricated by block copolymer template with supercritical carbon dioxide (BSTSC).
