入門講座「中性子実験装置（定常炉編）」
中性子反射率計
2014 年 24 巻 3 号 p. 200-205
詳細
2014 年 24 巻 3 号 p. 200-205
The neutron reflectometer is the most powerful and nondestructive tool to analyze the surface and buried interfaces in the layered films. Such films often have a close relation to the functional devices. Structural information in the vicinity of the interfaces is a key parameter in the field of the nanoscale science.
