2018 年 28 巻 4 号 p. 187-191
A promising novel technique has been developed to visualize the inhomogeneity of buried layers and interfaces in thin films non-destructively. The present technique gives real-space neutron image corresponding to positions in the sample, by combining the image reconstruction method and neutron reflectivity, which is extremely sensitive to the layered structures. It has become possible to obtain neutron reflectivity profile at each local point in the sample, without the use of micro beam.