偏極中性子反射率法で視る表面・界面・薄膜構造

抄録

We have introduced polarized neutron reflectivity (PNR) techniques, polarization analysis and magnetic contrast variation neutron reflectivity (MCV-NR), for structural analysis of soft material samples. We performed polarization analysis on an Si/SiO₂/polypropylene (PP) sample and MCV-NR analysis on a deuterated polystyrene (PS-d)/Fe₃O₄ sample to investigate their fine structures. Fitting analysis results of the NR data with polarization analysis indicated that the bulk PP plate penetrated into the SiO₂ layer due to the sandwiching of the silicon-substrate and PP. On the other hand, the MCV-NR analysis reveals the surface roughness value of the PS-d/Fe₃O₄ sample to be 2.2 Å. The structural analysis using the NR with the polarization analysis and MCV-NR enables the investigation of fine structures of soft material samples, and the results lead to a better understanding of the nano-layers and surface structures of soft materials.