特集 「加速器を用いた医学・産業利用への新たな挑戦」
放射光XAFS分析の産業利用
2013 年 39 巻 2 号 p. 71-75
詳細
2013 年 39 巻 2 号 p. 71-75
X-ray Absorption Fine Structure (XAFS) is a powerful tool to investigate the valence and local structure of the element in the functional materials that is necessary to the industrial products. For example, the estimation of the valence states of Eu luminescent centers in the surface and internal bulk of BAM phosphor particle have been performed.
