電気学会論文誌C(電子・情報・システム部門誌)
Online ISSN : 1348-8155
Print ISSN : 0385-4221
ISSN-L : 0385-4221
<電子物性・デバイス>
セシウム含有モンモリロナイトの軟X線放射光光電子分光
寺岡 有殿
著者情報
ジャーナル 認証あり

2020 年 140 巻 4 号 p. 412-416

詳細
抄録

High resolution photoemission spectroscopy with soft X-ray synchrotron radiation has been applied to montmorillonite, one of phyllosilicate compounds. Charge build-up is inevitable in the powder sample due to its insulating property so that photoemission peaks of element components are difficult to be assigned. On the other hand, photoemission peaks have been observed at their original peak positions without the charge shift. These non-shifted peaks enabled determination of binding energies of element components. Information on chemical bonding states of cesium, adsorbed artificially in the montmorillonite, has been also obtained.

著者関連情報
© 2020 電気学会
前の記事 次の記事
feedback
Top